Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials
Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp (auth.)This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.
Thể loại:
Năm:
2010
In lần thứ:
2
Nhà xuát bản:
Springer-Verlag Berlin Heidelberg
Ngôn ngữ:
english
Trang:
258
ISBN 10:
3642024165
ISBN 13:
9783642024160
Loạt:
Springer Series in Advanced Microelectronics 10
File:
PDF, 6.25 MB
IPFS:
,
english, 2010
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